1. Powder metallurgical materials and products. Methods of testing and chemical analysis of hardmetals. Determination of Young's modulus Part 4-4.7, (28th February 1979) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (4 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, BF, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level. (15th October 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (9 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX, BF and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non- temperature controlled). Full assessment level. (15th October 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (9 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (8 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Measurement of quartz crystal unit parameters. Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network Part 1, (15th August 2000) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Transformers and inductors for use in electronic and telecommunication equipment. Measuring methods and test procedures. (9th September 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (98 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Electromagnetic compatibility (EMC). Limits. Assessment of emission limits for the connection of distorting installations to MV, HV and EHV power systems Part 3-6, (22nd February 2008) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (60 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗