1. 21.2: Highly Reliable Oxide Thin Film Transistor with Novel Oxide Passivation Layers By All‐Printing Processes. Issue 1 (June 2015) Authors: Matsumoto, Shinji; Saotome, Ryoichi; Hirano, Yukiko; Sone, Yuji; Arae, Sadanori; Kusayanagi, Minehide; Nakamura, Yuki; Ueda, Naoyuki; Yamada, Katsuyuki Journal: Digest of technical papers Issue: Volume 46:Issue 1(2015) Page Start: 278 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗