21.2: Highly Reliable Oxide Thin Film Transistor with Novel Oxide Passivation Layers By All‐Printing Processes. Issue 1 (June 2015)
- Record Type:
- Journal Article
- Title:
- 21.2: Highly Reliable Oxide Thin Film Transistor with Novel Oxide Passivation Layers By All‐Printing Processes. Issue 1 (June 2015)
- Main Title:
- 21.2: Highly Reliable Oxide Thin Film Transistor with Novel Oxide Passivation Layers By All‐Printing Processes
- Authors:
- Matsumoto, Shinji
Saotome, Ryoichi
Hirano, Yukiko
Sone, Yuji
Arae, Sadanori
Kusayanagi, Minehide
Nakamura, Yuki
Ueda, Naoyuki
Yamada, Katsuyuki - Abstract:
- Abstract : We have developed highly reliable oxide TFT arrays by allprinted maskless process from gate to passivation layers with 100 ppi RGB resolution. The threshold voltage shifts under positive and negative bias‐temperature‐stress at 50 °C after 10 5 seconds were less than 0.8 and 0.3 V, respectively.
- Is Part Of:
- Digest of technical papers. Volume 46:Issue 1(2015)
- Journal:
- Digest of technical papers
- Issue:
- Volume 46:Issue 1(2015)
- Issue Display:
- Volume 46, Issue 1 (2015)
- Year:
- 2015
- Volume:
- 46
- Issue:
- 1
- Issue Sort Value:
- 2015-0046-0001-0000
- Page Start:
- 278
- Page End:
- 281
- Publication Date:
- 2015-06
- Subjects:
- Oxide TFT -- Printed electronics -- Oxide passivation layer -- Reliability
Information display systems -- Congresses
621.3815422 - Journal URLs:
- http://catalog.hathitrust.org/api/volumes/oclc/1799368.html ↗
http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)2168-0159 ↗
http://ojps.aip.org/dbt/dbt.jsp?KEY=SIDSYM ↗
http://sid.aip.org/digest ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/sdtp.10475 ↗
- Languages:
- English
- ISSNs:
- 0097-966X
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 8271.680000
British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 8662.xml