1. Low magnetic field Impact on NBTI degradation. Issue 9 (August 2015) Authors: Merah, S.M.; Nadji, B.; Tahi, H. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1460 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗