1. Word line program disturbance based data retention error recovery strategy for MLC NAND Flash. (July 2015) Authors: Ma, Haozhi; Pan, Liyang; Song, Changlai; Gao, Zhongyi; Wu, Dong; Xu, Jun Journal: Solid-state electronics Issue: Volume 109(2015) Page Start: 1 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗