121. A methodologic project to characterize and model COTS component reliability. Issue 9 (August 2015) Authors: Durier, A.; Bensoussan, A.; Zerarka, M.; Ghfiri, C.; Boyer, A.; Frémont, H. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 2097 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
122. A methodology for projecting SiO2 thick gate oxide reliability on trench power MOSFETs and its application on MOSFETs VGS rating. (March 2016) Authors: Efthymiou, E.; Rutter, P.; Whiteley, P. Journal: Microelectronics and reliability Issue: Volume 58(2016) Page Start: 26 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
123. A methodology to calculate the equivalent static loading for simulating electronic assemblies under impact. (December 2022) Authors: Gharaibeh, Mohammad A.; Pitarresi, James M. Journal: Microelectronics and reliability Issue: Volume 139(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
124. A methodology to determine reliability issues in automotive SiC power modules combining 1D and 3D thermal simulations under driving cycle profiles. (November 2019) Authors: Matallana, A.; Robles, E.; Ibarra, E.; Andreu, J.; Delmonte, N.; Cova, P. Journal: Microelectronics and reliability Issue: Volume 102(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
125. A mission profile-based reliability analysis framework for photovoltaic DC-DC converters. (September 2019) Authors: Van De Sande, W.; Ravyts, S.; Sangwongwanich, A.; Manganiello, P.; Yang, Y.; Blaabjerg, F.; Driesen, J.; Daenen, M. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
126. A mixed-effects model of two-phase degradation process for reliability assessment and RUL prediction. (April 2020) Authors: Wang, Hongyu; Ma, Xiaobing; Zhao, Yu Journal: Microelectronics and reliability Issue: Volume 107(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
127. A modified boost rectifier for elimination of circulating current in power factor correction applications. (February 2017) Authors: Venkitusamy, Karthikeyan; Padmanaban, Sanjeevikumar; Pecht, Michael; Awasthi, Abhishek; Selvamuthukumaran, Rajasekar Journal: Microelectronics and reliability Issue: Volume 69(2017) Page Start: 29 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
128. A modified two dimensional analytical model for short-channel fully depleted SOI MESFET's. (April 2018) Authors: Mohammadi, Hossein; Abdullah, Huda; Dee, Chang Fu; Susthitha Menon, P. Journal: Microelectronics and reliability Issue: Volume 83(2018) Page Start: 173 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
129. A multi-parameter fitting method based on matrix transformation for device aging modeling. (March 2023) Authors: Sang, Qianqian; Yang, Xinhuan; Zhang, Jianyu; Wang, Chuanzheng; Yu, Mingyan; Zhao, Yuanfu Journal: Microelectronics and reliability Issue: Volume 142(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
130. A multi-port thermal coupling model for multi-chip power modules suitable for circuit simulators. (September 2018) Authors: Wang, Z.X.; Wang, H.; Zhang, Y.; Blaabjerg, F. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 519 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗