1. A fusion prognostics-based qualification test methodology for microelectronic products. (August 2016) Authors: Pecht, Michael; Shibutani, Tadahiro; Kang, Myeongsu; Hodkiewicz, Melinda; Cripps, Edward Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 320 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A fusion prognostics-based qualification test methodology for microelectronic products. (August 2016) Authors: Pecht, Michael; Shibutani, Tadahiro; Kang, Myeongsu; Hodkiewicz, Melinda; Cripps, Edward Journal: Microelectronics and reliability Issue: Volume 63(2016) Page Start: 320 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗