671. Analytical approximation of surface potential and analysis of C–V characteristics of bulk MOSFETs at cryogenic temperatures. (November 2022) Authors: Manzoor, Wajid; Dutta, Aloke K.; Chauhan, Yogesh Singh Journal: Microelectronics journal Issue: Volume 129(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
672. Analytical drain current model development of twin gate TFET in subthreshold and super threshold regions. (May 2023) Authors: Raut, Pratikhya; Nanda, Umakanta; Panda, Deepak Kumar Journal: Microelectronics journal Issue: Volume 135(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
673. Analytical model for high-k SOI pLDMOS with self-adaptive balance of polarization charge. (February 2023) Authors: Wu, Lijuan; Qiu, Tao; Song, Xuanting; Zhang, Banghui; Liu, Heng; Liu, Qing Journal: Microelectronics journal Issue: Volume 132(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
674. Analytical model of subthreshold drain current for nanoscale negative capacitance junctionless FinFET. (March 2022) Authors: Kaushal, Shelja; Rana, Ashwani K. Journal: Microelectronics journal Issue: Volume 121(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
675. Analytical model of surface potential and threshold voltage in gate-drain overlap FinFET. (May 2018) Authors: Das, Rajashree; Baishya, Srimanta Journal: Microelectronics journal Issue: Volume 75(2018) Page Start: 153 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
676. Analytical modelling and sensitivity analysis of Gallium Nitride-Gate Material and, dielectric engineered- Schottky nano-wire fet(GaN-GME-DE-SNW-fet) based label-free biosensor. (November 2022) Authors: Sharma, Swati; Nath, Vandana; Deswal, S.S.; Gupta, R.S. Journal: Microelectronics journal Issue: Volume 129(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
677. Analytical models for channel potential, threshold voltage, and subthreshold swing of junctionless triple-gate FinFETs. (April 2016) Authors: Hu, Guangxi; Hu, Shuyan; Feng, Jianhua; Liu, Ran; Wang, Lingli; Zheng, Lirong Journal: Microelectronics journal Issue: Volume 50(2016) Page Start: 60 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
678. Analytical models for channel potential, threshold voltage, and subthreshold swing of junctionless triple-gate FinFETs. (April 2016) Authors: Hu, Guangxi; Hu, Shuyan; Feng, Jianhua; Liu, Ran; Wang, Lingli; Zheng, Lirong Journal: Microelectronics journal Issue: Volume 50(2016) Page Start: 60 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
679. Analytical phase noise study of a back-gate coupled colpitts quadrature VCO. (June 2020) Authors: Ebrahimi, Emad; Naseh, Sasan; Ebrahimi, Ali; Maymandi-Nejad, Mohammad Journal: Microelectronics journal Issue: Volume 100(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
680. Analytical PSpice model for SiC MOSFET based high power modules. (July 2016) Authors: Johannesson, Daniel; Nawaz, Muhammad Journal: Microelectronics journal Issue: Volume 53(2016) Page Start: 167 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗