1. On the diffusion current in a MOSFET operated down to deep cryogenic temperatures. (February 2021) Authors: Ghibaudo, G.; Aouad, M.; Casse, M.; Poiroux, T.; Theodorou, C. Journal: Solid-state electronics Issue: Volume 176(2021) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗