1. Current induced degradation study on state of the art DUV LEDs. (September 2018) Authors: Trivellin, N.; Monti, D.; De Santi, C.; Buffolo, M.; Meneghesso, G.; Zanoni, E.; Meneghini, M. Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 868 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗