1. Electrical characterization of high k-dielectrics for 4H-SiC MIS devices. (1st August 2019) Authors: Khosa, R.Y.; Chen, J.T.; Winters, M.; Pálsson, K.; Karhu, R.; Hassan, J.; Rorsman, N.; Sveinbjӧrnsson, E.Ö. Journal: Materials science in semiconductor processing Issue: Volume 98(2019) Page Start: 55 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗