1. Graphical symbols for electrical power, telecommunications and electronics diagrams. Guide for binary logic elements Part 12, (30th August 1991) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (248 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital gate circuits (general application category). (1st December 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital inverter circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Rules for the preparation of detail specifications for integrated circuits of assessed quality: insulated gate shift registers. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (13 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary counter circuits. General application category. (1st December 1973) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital bistable circuits. General application category. (1st December 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital gate circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital interconnected gate circuits. General application category. (18th October 1985) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital inverter circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits. (15th May 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (27 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗