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Subject Integrated circuits -- Very large scale integration -- Testing -- Congresses

1. VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers /: 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers. (2017)

Editors:
Kaushik, Brajesh Kumar; Dasgupta, Sudeb; Singh, Virendra
Other Names:
VDAT (Symposium), 21st
Record Type:
Book
Extent:
1 online resource (xxi, 815 pages), illustrations
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

2. VLSI design and test : 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers /: 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised selected papers. (2019)

Editors:
Sengupta, Anirban; Dasgupta, Sudeb; (Associate professor of electrical engineering), Singh, Virendra; Sharma, Rohit (Rohit Y.); Vishvakarma, Santosh Kumar
Other Names:
VDAT (Symposium), 23rd
Record Type:
Book
Extent:
1 online resource (xvi, 775 pages), illustrations (some color)
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

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  • Integrated circuits -- Very large scale integration -- Testing -- Congresses 2