251. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU). (15th May 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
252. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories. (15th February 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
253. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear analogue-to-digital converters (ADC). (15th February 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
254. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC). (15th February 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
255. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Monolithic integrated operational amplifiers. (31st December 1991) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
256. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification: integrated circuit static read/write memories. (15th September 1993) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
257. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB. (15th May 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
258. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Blank detail specification. Microprocessor integrated circuits. (15th May 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
259. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU. (15th May 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
260. Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test. (31st October 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (104 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗