241. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: integrated line transmitters and receivers. (15th September 1985) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
242. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: programmable logic arrays (PLA). (15th July 1990) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
243. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: tantalum chip capacitors. (31st March 1983) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (13 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
244. Specification for harmonized system of quality assessment for electronic components. Family specification. Digital integrated HC MOS circuits series HC/HCT/HCU. (15th November 1986) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
245. Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB. (15th August 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
246. Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS. (2nd June 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (23 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
247. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays). (31st January 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
248. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Complementary MOS digital integrated circuits (series 4000 B and 4000 UB). (1st May 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
249. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Film and hybrid integrated circuits: capability approval. (15th November 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
250. Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Film and hybrid integrated circuits: qualification approval procedure. (28th February 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗