1. A novel stability and process sensitivity driven model for optimal sized FinFET based SRAM. Issue 8 (July 2015) Authors: Yadav, Nandakishor; Jain, Shikha; Pattanaik, Manisha; Sharma, G.K. Journal: Microelectronics and reliability Issue: Volume 55:Issue 8(2015) Page Start: 1131 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗