1. Design and implementation of a low cost test bench to assess the reliability of FPGA. Issue 9 (August 2015) Authors: Naouss, M.; Marc, F. Journal: Microelectronics and reliability Issue: Volume 55:Issue 9/10(2015) Page Start: 1341 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗