1. Reducing false positives due to double adjacent errors in instruction TLBs. (November 2019) Authors: Sánchez-Macián, A.; Aranda, L.A.; Reviriego, P.; Maestro, J.A. Journal: Microelectronics and reliability Issue: Volume 102(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗