1. Kelvin probe force microscopy : from single charge detection to device characterization /: from single charge detection to device characterization. ([2018]) Editors: Sadewasser, Sascha; Glatzel, Thilo Record Type: Book Extent: 1 online resource (XXIV, 521 pages), 234 illustrations, 194 illustrations in color View Content: Available online (eLD content is only available in our Reading Rooms) ↗