1. Process Variability for Devices at and beyond the 7 nm Node. (17th October 2018) Authors: Lorenz, J. K.; Asenov, A.; Baer, E.; Barraud, S.; Kluepfel, F.; Millar, C.; Nedjalkov, M. Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 11(2018) Page Start: P595 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Process Variability for Devices at and beyond the 7 nm Node. (1st January 2018) Authors: Lorenz, J. K.; Asenov, A.; Baer, E.; Barraud, S.; Kluepfel, F.; Millar, C.; Nedjalkov, M. Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 11(2018) Page Start: P595 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗