1. Deep Level Assessment of n-Type Si/SiO2 Metal-Oxide-Semiconductor Capacitors with Embedded Ge Quantum Dots. (1st January 2018) Authors: Aouassa, M.; Vrielinck, H.; Simoen, E. Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 2(2018) Page Start: P24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Deep Level Assessment of n-Type Si/SiO2 Metal-Oxide-Semiconductor Capacitors with Embedded Ge Quantum Dots. (5th January 2018) Authors: Aouassa, M.; Vrielinck, H.; Simoen, E. Journal: ECS journal of solid state science and technology Issue: Volume 7:Number 2(2018) Page Start: P24 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗