11. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (8 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
12. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX, BF and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non- temperature controlled). Full assessment level. (15th October 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (9 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
13. Dimensions of piezoelectric devices. Specification for standard outlines and pin connections for quartz crystal units Part 1, (30th September 1980) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (98 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
14. Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval). (15th April 1996) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
15. Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval). (31st December 1990) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
16. Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators. (15th August 1993) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (70 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
17. Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval). (15th August 1993) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
18. Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval). (15th April 1995) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (30 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
19. Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (qualification approval). (31st May 1991) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
20. Measurement of quartz crystal unit parameters. Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network Part 1, (15th August 2000) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (32 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗