1. Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level. (15th March 1983) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Blank detail specification for quartz crystal units of assessed quality: basic assessment level. (15th August 1984) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (9 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. BS EN 60444-6. Measurement of quartz crystal unit parameters. Part 6. Measurement of drive level dependence (DLD) (1st May 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. BS EN 63041-1 Ed.2.0. Piezoelectric sensors. Part 1. Generic specifications (12th May 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (28 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. BS EN IEC 60122-2. Quartz crystal units of assessed quality. Part 2. Guide to the use (12th April 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (37 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. BS EN IEC 63041-1. Piezoelectric sensors. Part 1. Generic specifications (25th September 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (29 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, BF, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level. (15th October 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges. Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 17 to 75 MHz frequency range. Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (10 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Detail specification for solder-sealed quartz crystal units for oscillator applications. AA, CX and BC/1 enclosures, 50 to 125 MHz frequency range. Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled). Full assessment level. (15th June 1977) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (9 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗