1. A body built-in cell for detecting transient faults and dynamically biasing subcircuits of integrated systems. (September 2018) Authors: Ferreira de Paiva Leite, Thiago; Fesquet, Laurent; Possamai Bastos, Rodrigo Journal: Microelectronics and reliability Issue: Volume 88/90(2018) Page Start: 122 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗