1. S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application. (September 2019) Authors: Moultif, N.; Latry, O.; Ndiaye, M.; Neveu, T.; Joubert, E.; Moreau, C.; Goupy, J-F. Journal: Microelectronics and reliability Issue: Volume 100/101(2019) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗