1. 10 nm three-dimensional localization using Bessel beam microscopy. (17th January 2020) Authors: Chakraborty, Chumki; Islam, Md Anisul; Snoeyink, Craig Journal: Measurement science & technology Issue: Volume 31:Number 4(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗