10 nm three-dimensional localization using Bessel beam microscopy. (17th January 2020)

• Record Type: Journal Article
• Authors: Chakraborty, Chumki; Islam, Md Anisul; Snoeyink, Craig
• Is Part Of: Measurement science & technology. Volume 31:Number 4(2020)
• Publication Date: 2020-01-17
• Subjects: 3D localization -- microscopy -- axicon; Physical measurements -- Periodicals; Scientific apparatus and instruments -- Periodicals; Equipment and Supplies -- Periodicals; Science -- instrumentation -- Periodicals; Technology -- instrumentation -- Periodicals; Mesures physiques -- Périodiques; Physical measurements; Scientific apparatus and instruments; Periodicals; 502.87
• DOI: 10.1088/1361-6501/ab5ea7
• Languages: English
• ISSNs: 0957-0233

Abstract

Abstract: The last decade has seen significant advances in 3D localization precision driven by demanding applications in biological super-resolution microscopy. These applications have been constrained by precision in the z direction, which had previously been limited to above 10 nm for general applications. Here we present sub-10 nm localization precision using Bessel beam microscopy (BBM) at application-relevant photon counts. BBM uses an axicon, a conical optical element, to transform the point spread function of a microscope to a Bessel pattern, the spatial frequency of which is a simple function of emitter depth. We describe the BBM optical system, outline a method for image analysis, and demonstrate localization of fluorescent silver core silica nanoparticles with better than 10 nm precision in all directions.