1. In-situ High Temperature X-ray Diffraction Study of the Am-O System. Issue 62 (16th February 2017) Authors: Epifano, E.; Belin, R. C.; Richaud, J-C; Vauchy, R.; Strach, M.; Lebreton, F.; Delahaye, T.; Guéneau, C.; Martin, P. M. Journal: MRS advances Issue: Volume 1:Issue 62(2016) Page Start: 4133 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗