In-situ High Temperature X-ray Diffraction Study of the Am-O System. Issue 62 (16th February 2017)

• Record Type: Journal Article
• Authors: Epifano, E.; Belin, R. C.; Richaud, J-C; Vauchy, R.; Strach, M.; Lebreton, F.; Delahaye, T.; Guéneau, C.; Martin, P. M.
• Is Part Of: MRS advances. Volume 1:Issue 62(2016)
• Page Start: 4133
• Page End: 4137
• Publication Date: 2017-02-16
• Subjects: X-Ray diffraction, -- actinide, -- oxide; Electrical engineering -- Congresses; Physics -- Congresses; Materials -- Research -- Congresses; Materials science -- Congresses; 620.11
• DOI: 10.1557/adv.2017.200
• Languages: English
• ISSNs: 2059-8521

Abstract

ABSTRACT: In the frame of minor actinide recycling, (U, Am)O2 are promising transmutation targets. To assess the thermodynamic properties of the U-Am-O system, it is essential to have a thorough knowledge of the binary phase diagrams, which is difficult due to the lack of thermodynamic data on the Am-O system. Nevertheless, an Am-O phase diagram modelling has been recently proposed by Gotcu. Here, we show a recent investigation of the Am-O system using in-situ High Temperature X-ray Diffraction under controlled atmosphere. By coupling our experimental results with the thermodynamic calculations based on the Gotcu model, we propose for the first time a relation between the lattice parameter and the departure from stoichiometry.