1. Kelvin probe force microscopy : from single charge detection to device characterization /: from single charge detection to device characterization. ([2018]) Editors: Sadewasser, Sascha; Glatzel, Thilo Record Type: Book Extent: 1 online resource (XXIV, 521 pages), 234 illustrations, 194 illustrations in color View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Nanoscale imaging and characterisation of amyloid-[beta]. (2016) Authors: Tinker-Mill, Claire Louisa Record Type: Book Extent: 1 online resource (xx, 149 pages), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy /: atomic force microscopy and scanning tunneling microscopy. ([2015]) Authors: Voigtländer, Bert Record Type: Book Extent: 1 online resource, illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗