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- Microscopy [remove]688
- Volume 63:Number 1(2014:Feb.)17
- Volume 63:Number 3(2014:Jun.)1
- Volume 63:Number 3(2014:Jun.)Supplement2
- Volume 63:Number 4(2014:Aug.)1
- Volume 64(2015)Supplement 139
- Volume 64:Number 1(2015:Feb.)2
- Volume 64:Number 2(2015:Apr.)2
- Volume 64:Number 4(2015:Aug.)1
- Volume 64:Number 5(2015:Oct.)1
- Volume 65:Number 3(2016:Jun.)1
- Ikuhara, Yuichi 15
- Ohta, Keisuke 15
- Tamaoki, Daisuke 13
- Harada, Ken 12
- Karahara, Ichirou 12
- Mineyuki, Yoshinobu 12
- Matsuda, Kenji 11
- Mori, Shigeo 11
- Shibata, Naoya 11
- Uesugi, Kentaro 11
- 502.825 688
- Microscopy -- Periodicals 688
- spectrum imaging -- non-rigid registration -- beam damage -- dose-rate -- data compression 3
- BSE -- EDX -- variable accelerating voltage -- low vacuum SEM -- cryo SEM -- plant cells 2
- EELS -- ELNES -- EXELFS -- molybdenum -- zirconium -- tin 2
- EELS -- direct electron detector -- spectroscopy -- in situ -- protein -- cryo-EM 2
- EMCD -- convergence angle -- collection angle -- aperture position -- signal-to-noise ratio -- STEM 2
- STEM -- spectrum image -- 4D-STEM -- mapping at high resolution -- scanning image distortion 2
- TEM -- DPC -- COM -- pixelated detector -- ptychography -- 4D STEM 2
- TEM -- EELS -- delocalization -- inelastic scattering 2