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22. A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation. Issue 1670 (17th June 2014)

23. A Comprehensive Study of Effect of Composition on Resistive Switching of HfxAl1-xOy based RRAM devices by Combinatorial Sputtering. Issue 1729 (11th February 2015)

24. A Comprehensive Study of Effect of Composition on Resistive Switching of HfxAl1-xOy based RRAM devices by Combinatorial Sputtering. Issue 1729 (2015)

29. A Differential Scanning Calorimetric Study of Carbide Transition in 10Cr Tempered Martensitic Steels. Issue 1754 (10th June 2015)

30. A Differential Scanning Calorimetric Study of Carbide Transition in 10Cr Tempered Martensitic Steels. Issue 1754 (2015)