1. BS EN 60749-28. Semiconductor devices. Mechanical and climatic test methods. Part 28. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level (21st November 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (51 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗