Is Part Of: Solid-state electronics. Volume 176(2021) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Solid-state electronics. Volume 176(2021)

1. Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies. (February 2021)

Authors:: Pérez, Eduardo; Maldonado, David; Acal, Christian; Ruiz-Castro, Juan Eloy; Aguilera, Ana María; Jiménez-Molinos, Francisco; Roldán, Juan Bautista; Wenger, Christian
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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Record Type:: Journal Article
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2. Carbon-based, all-inorganic, lead-free Ag2BiI5 rudorffite solar cells with high photovoltages. (February 2021)

Authors:: He, Fengqin; Wang, Qian; Zhu, Weidong; Chen, Dazheng; Zhang, Jincheng; Zhang, Chunfu; Hao, Yue
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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3. Comparative study of metamorphic InAs layers grown on GaAs and Si for mid-infrared photodetectors. (February 2021)

Authors:: Ryu, Geunhwan; Kang, Soo Seok; Han, Jae-Hoon; Chu, Rafael Jumar; Jung, Daehwan; Choi, Won Jun
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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Record Type:: Journal Article
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4. Editorial Board. (February 2021)

Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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5. Effect of organic solvent vapor treatment on transistor performance and contact resistance of copper phthalocyanine based organic field-effect transistors. (February 2021)

Authors:: Kumar, Pankaj; Yadav, Sarita; Kumar, Naresh; Kumar, Lokendra
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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6. High performance InGaAs channel MOSFETs on highly resistive InAlAs buffer layers. (February 2021)

Authors:: Lee, Sang Tae; Lee, In-Geun; Jang, Hyunchul; Kong, Minwoo; Song, Changhun; Kim, Chang Zoo; Jung, Sang Hyun; Choi, Youngsu; Kim, Shinkeun; Eom, Su-keun; Seo, Kwang-seok; Kim, Dae-Hyun; Ko, Dae-Hong; Shin, Chan-Soo
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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7. Indium oxide nanoparticles for resistive RAM integration using a compatible industrial technology. (February 2021)

Authors:: Guenery, P.V.; León Pérez, E.A.; Ayadi, K.; Baboux, N.; Deleruyelle, D.; Blonkowski, S.; Moeyaert, J.; Baron, T.; Militaru, L.; Souifi, A.
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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8. On the diffusion current in a MOSFET operated down to deep cryogenic temperatures. (February 2021)

Authors:: Ghibaudo, G.; Aouad, M.; Casse, M.; Poiroux, T.; Theodorou, C.
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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9. Stochastic multiscale model for HfO2-based resistive random access memories with 1T1R configuration. (February 2021)

Authors:: Guitarra, Silvana; Raymond, Laurent; Trojman, Lionel
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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10. Trapping effects on AlGaN/GaN HEMT characteristics. (February 2021)

Authors:: Vigneshwara Raja, P.; Nallatamby, Jean-Christophe; DasGupta, Nandita; DasGupta, Amitava
Journal:: Solid-state electronics
Issue:: Volume 176(2021)
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Record Type:: Journal Article
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