Search
Search Constraints
You searched for: Is Part Of Solid-state electronics. Volume 128(2017)Limit your search
- 621.38152 31
- Semiconducteurs -- Périodiques 31
- Semiconductors -- Periodicals 31
- 3D monolithic -- InGaAs -- RMG -- High-frequency -- FinFET 1
- 3D pixel -- APD -- SPAD -- SOI -- FDSOI -- Geiger-mode -- Avalanche diode -- TCAD simulations -- Back-side illumination -- Avalanche triggering probability -- Dark count rate -- Photon detection probability -- Time-of-flight applications 1
- Analog performance -- Nanowires -- Fin width influence -- Temperature influence -- Mobility 1
- CMOS -- Electrostatic discharges -- ESD -- FD-SOI -- Gated diode -- LBJT -- MOSFET -- SOI -- Thyristor 1
- CMOS -- Ultra-Thin-Body and Buried-Oxide Fully-Depleted-On-Insulator (UTBB FDSOI) -- SiGe -- Stress -- Strain -- Layout effects -- Length of diffusion (LOD) -- SA/SB parameters -- Threshold voltage -- Mobility 1
- Drift-diffusion model -- Resistive mixer -- Plasma waves -- THz detectors 1
- Effective work function -- Equivalent oxide thickness -- Channel thickness -- Buried oxide thickness -- Fully depleted silicon on insulator 1