Is Part Of: Microscopy and microanalysis. Volume 23:Number 4(2017) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microscopy and microanalysis. Volume 23:Number 4(2017)

1. A Comprehensive Approach Towards Optimizing the Xenon Plasma Focused Ion Beam Instrument for Semiconductor Failure Analysis Applications. (5th June 2017)

Authors:: Subramaniam, Srinivas; Huening, Jennifer; Richards, John; Johnson, Kevin
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 769
Record Type:: Journal Article
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2. A Small Spot, Inert Gas, Ion Milling Process as a Complementary Technique to Focused Ion Beam Specimen Preparation. (19th June 2017)

Authors:: Fischione, Paul E.; Williams, Robert E.A.; Genç, Arda; Fraser, Hamish L.; Dunin-Borkowski, Rafal E.; Luysberg, Martina; Bonifacio, Cecile S.; Kovács, András
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 782
Record Type:: Journal Article
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3. Atomic Scale Structural Characterization of Epitaxial (Cd, Cr)Te Magnetic Semiconductor. (7th June 2017)

Authors:: Bonef, Bastien; Boukari, Hervé; Grenier, Adeline; Mouton, Isabelle; Jouneau, Pierre-Henri; Kinjo, Hidekazu; Kuroda, Shinji
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 717
Record Type:: Journal Article
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4. Automated Image Acquisition for Low-Dose STEM at Atomic Resolution. (23rd May 2017)

Authors:: Mittelberger, Andreas; Kramberger, Christian; Hofer, Christoph; Mangler, Clemens; Meyer, Jannik C.
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 809
Record Type:: Journal Article
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5. Design and Fabrication of a Three-Dimensional In Vitro System for Modeling Vascular Stenosis. (17th July 2017)

Authors:: Jones, Rebecca S.; Chang, Pin H.; Perahia, Tzlil; Harmon, Katrina A.; Junor, Lorain; Yost, Michael J.; Fan, Daping; Eberth, John F.; Goodwin, Richard L.
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 859
Record Type:: Journal Article
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6. Focused Ion Beam Preparation of Specimens for Micro-Electro-Mechanical System-based Transmission Electron Microscopy Heating Experiments. (5th June 2017)

Authors:: Vijayan, Sriram; Jinschek, Joerg R.; Kujawa, Stephan; Greiser, Jens; Aindow, Mark
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 708
Record Type:: Journal Article
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7. Histomorphometric Parameters of the Growth Plate and Trabecular Bone in Wild-Type and Trefoil Factor Family 3 (Tff3)-Deficient Mice Analyzed by Free and Open-Source Image Processing Software. (15th June 2017)

Authors:: Bijelić, Nikola; Belovari, Tatjana; Stolnik, Dunja; Lovrić, Ivana; Baus Lončar, Mirela
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 818
Record Type:: Journal Article
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8. In Situ Thermal Annealing Transmission Electron Microscopy (TEM) Investigation of III/V Semiconductor Heterostructures Using a Setup for Safe Usage of Toxic and Pyrophoric Gases. (8th August 2017)

Authors:: Straubinger, Rainer; Beyer, Andreas; Ochs, Thomas; Stolz, Wolfgang; Volz, Kerstin
Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: 751
Record Type:: Journal Article
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9. MAM volume 23 issue 4 Cover and Back matter. (8th August 2017)

Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: b1
Record Type:: Journal Article
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10. MAM volume 23 issue 4 Cover and Front matter. (8th August 2017)

Journal:: Microscopy and microanalysis
Issue:: Volume 23:Number 4(2017)
Page Start:: f1
Record Type:: Journal Article
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