Is Part Of: Microelectronics and reliability. Volume 70(2017) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Is Part Of Microelectronics and reliability. Volume 70(2017)

1. Book review. (March 2017)

Authors:: Gan, Chong Leong; Moideen, Mohamad Zainudeen
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 122
Record Type:: Journal Article
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2. Comparison of hydrothermal performance between plate fins and plate-pin fins subject to nanofluid-cooled corrugated miniature heat sinks. (March 2017)

Authors:: Khoshvaght-Aliabadi, M.; Hassani, S.M.; Mazloumi, S.H.
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 84
Record Type:: Journal Article
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3. Corrosion behavior of crystalline silicon solar cells. (March 2017)

Authors:: Xiong, Huaping; Gan, Chuanhai; Yang, Xiaobing; Hu, Zhigang; Niu, Haiyan; Li, Jianfeng; Si, Jianfang; Xing, Pengfei; Luo, Xuetao
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 49
Record Type:: Journal Article
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4. Editorial Board. (March 2017)

Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: IFC
Record Type:: Journal Article
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5. Effects of dimension parameters and defect on TSV thermal behavior for 3D IC packaging. (March 2017)

Authors:: Pan, Yuanxing; Li, Fei; He, Hu; Li, Junhui; Zhu, Wenhui
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 97
Record Type:: Journal Article
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6. Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors. (March 2017)

Authors:: Whiting, P.G.; Holzworth, M.R.; Lind, A.G.; Pearton, S.J.; Jones, K.S.; Liu, L.; Kang, T.S.; Ren, F.; Xin, Y.
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 32
Record Type:: Journal Article
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7. Interacting multiple model particle filter for prognostics of lithium-ion batteries. (March 2017)

Authors:: Su, Xiaohong; Wang, Shuai; Pecht, Michael; Zhao, Lingling; Ye, Zhe
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 59
Record Type:: Journal Article
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8. Investigation of dependence between time-zero and time-dependent variability in high-κ NMOS transistors. (March 2017)

Authors:: Hassan, Mohammad Khaled; Roy, Kaushik
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 22
Record Type:: Journal Article
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9. Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface. (March 2017)

Authors:: Higashi, Yusuke; Takaishi, Riichiro; Kato, Koichi; Suzuki, Masamichi; Nakasaki, Yasushi; Tomita, Mitsuhiro; Mitani, Yuichiro; Matsumoto, Masuaki; Ogura, Shohei; Fukutani, Katsuyuki; Yamabe, Kikuo
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 12
Record Type:: Journal Article
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10. Methods of sequential test optimization in dynamic environment. (March 2017)

Authors:: Yang, Chenglin; Su, Ruoshan; Long, Bing
Journal:: Microelectronics and reliability
Issue:: Volume 70(2017)
Page Start:: 112
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗