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- 621.39 7
- Computer architecture -- Periodicals 7
- Computer engineering -- Periodicals 7
- Computer organization -- Periodicals 7
- Computers -- Periodicals 7
- Digital electronics -- Periodicals 7
- IoT‐connected devices -- hardware security issues -- Internet‐of‐Things‐Devices -- device‐to‐system design perspectives -- computation‐capacity limitations -- battery‐operated IoTD -- heavy‐duty crypto‐algorithms -- compromised hardwares -- lightweight algorithms -- hierarchically‐connected IoTD -- strong‐crypto‐algorithms -- consumption power -- two‐folded power‐aware implementation -- complexity overhead -- target IoT network -- IoT nodes -- RSA‐2048 -- communication standards -- message queuing telemetry transport -- IoT network -- DPA‐resistant two‐folded power‐aware RSA security -- communication protocols -- CCL RSA 1
- NBTI stress -- DSP core -- CE devices -- threat model -- performance estimation -- device aging -- critical failure mechanism -- nanoscale designs -- prolonged device degradation -- delay degradation -- threshold voltage -- input vector pattern -- performance degradation mechanism -- threat analysis -- negative bias temperature instability stress -- digital signal processing cores -- maximum degradation -- stress time -- no‐stress condition -- input vector samples -- input vectors identification 1
- ageing -- digital signal processing chips -- semiconductor device reliability -- integrated circuit reliability -- negative bias temperature instability -- failure analysis 1
- cryptography -- consumer electronics -- random number generation -- Internet -- authorisation 1