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You searched for: Date 2021 Journal Surface and interface analysis- 541.33 122
- Surface chemistry -- Periodicals 122
- Surfaces (Physics) -- Periodicals 122
- Thin films -- Periodicals 122
- 4H‐SiC -- band alignment -- heterojunction -- Mg2Si 1
- AES -- ASTM E42 -- ISO TC201 -- Martin Seah -- surface analysis -- XPS 1
- AES -- characterisation -- coating -- core -- core–shell -- electron spectroscopy -- ISO -- measurement -- nano -- nanoparticle -- NAP‐XPS -- shell -- standardisation -- synchrotron -- Technical Report -- thickness -- XPS 1
- AES -- differentiation -- dynamic background subtraction -- quantitative analysis -- Savitzky–Golay 1
- AFM -- AOES -- He/O2 mixture -- Langmuir probe -- polymer surface modification -- RF remote plasma -- XPS 1
- AFM and FTIR -- cellulosic manuscripts -- glazing -- graphene oxide -- museum -- preservation -- reflective index -- SEM -- static electricity -- TEM -- thin film deposition -- UV blocking 1