1. Insulation coordination for equipment within low-voltage systems. Application guide. Explanation of the application of the IEC 60664 series, dimensioning examples and dielectric testing Part 2-1, (31st January 2011) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (68 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Semiconductor devices. Mechanical and climatic test methods. Latch-up test Part 29, (31st August 2011) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗