Semiconductor devices. Mechanical and climatic test methods. Latch-up test Part 29, (31st August 2011)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 2011
• Extent: 1 online resource (26 pages)
• Subjects: 602.1841; Climate; Electrical testing; Overvoltage; Destructive testing; Failure rate; Environmental testing; Overvoltage tests; Mechanical testing; Electronic equipment and components; Integrated circuits; Semiconductor devices; Electrical faults; Electrical impedance
• Languages: English
• Related ISBNs: 9780580691386
• ISSNs: 3020-9747
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.