Journal: Microelectronics and reliability / Issue: Volume 85(2018) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Journal Microelectronics and reliability Issue Volume 85(2018)

1. A cross-layer aging-aware task scheduling approach for multiprocessor embedded systems. (June 2018)

Authors:: Karami, Masoomeh; Abdi, Athena; Zarandi, Hamid R.
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 190
Record Type:: Journal Article
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2. A generalized degradation model based on Gaussian process. (June 2018)

Authors:: Wang, Zhihua; Wu, Qiong; Zhang, Xiongjian; Wen, Xinlei; Zhang, Yongbo; Liu, Chengrui; Fu, Huimin
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 207
Record Type:: Journal Article
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3. A novel prediction method based on the support vector regression for the remaining useful life of lithium-ion batteries. (June 2018)

Authors:: Zhao, Qi; Qin, Xiaoli; Zhao, Hongbo; Feng, Wenquan
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 99
Record Type:: Journal Article
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4. A reverse hysteresis effect of graphene transistors with amorphous silicon gate dielectric. (June 2018)

Authors:: Zhang, Qingwei; Li, Ping; Liao, Yongbo; Wang, Gang; Zeng, Rongzhou; Wang, Heng
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 118
Record Type:: Journal Article
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5. Comphy — A compact-physics framework for unified modeling of BTI. (June 2018)

Authors:: Rzepa, G.; Franco, J.; O'Sullivan, B.; Subirats, A.; Simicic, M.; Hellings, G.; Weckx, P.; Jech, M.; Knobloch, T.; Waltl, M.; Roussel, P.J.; Linten, D.; Kaczer, B.; Grasser, T.
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 49
Record Type:: Journal Article
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6. Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length. (June 2018)

Authors:: Kim, Junyeap; Yoo, Hanbin; Lee, Heesung; Kim, Seong Kwang; Choi, Sungju; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 66
Record Type:: Journal Article
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7. Design, manufacture and test for reliable 3D printed electronics packaging. (June 2018)

Authors:: Tilford, Tim; Stoyanov, Stoyan; Braun, Jessica; Janhsen, Jan Christoph; Burgard, Matthias; Birch, Richard; Bailey, Chris
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 109
Record Type:: Journal Article
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8. Editorial Board. (June 2018)

Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: ii
Record Type:: Journal Article
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9. Effect of aging on mechanical properties of high temperature Pb-rich solder joints. (June 2018)

Authors:: Khatibi, G.; Betzwar Kotas, A.; Lederer, M.
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 1
Record Type:: Journal Article
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10. Effect of negative potential on the extent of PID degradation in photovoltaic power plant in a real operation mode. (June 2018)

Authors:: Hylský, Josef; Strachala, Dávid; Vyroubal, Petr; Čudek, Pavel; Vaněk, Jiří; Vanýsek, Petr
Journal:: Microelectronics and reliability
Issue:: Volume 85(2018)
Page Start:: 12
Record Type:: Journal Article
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