Journal: Microelectronics and reliability / Issue: Volume 79(2017) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Journal Microelectronics and reliability Issue Volume 79(2017)

1. 3-D thermal models calibration by parametric dynamic compact thermal models. (December 2017)

Authors:: Codecasa, Lorenzo; d'Alessandro, Vincenzo; Magnani, Alessandro; Rinaldi, Niccolò
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 371
Record Type:: Journal Article
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2. A new method to estimate the state of charge of the green battery. (December 2017)

Authors:: Li, Ling-Ling; Ren, Yu-Han; Wang, Ching-Hsin; Jen, Ching-Tsung
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 306
Record Type:: Journal Article
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3. Analysis of deep level defects in bipolar junction transistors irradiated by 2 MeV electrons. (December 2017)

Authors:: Ma, Yao; Xu, Pengfei; Guan, Mingyue; Boi, Filippo; Bo, Gao; Gong, Min; Wu, Xue; Wang, Yuxin; Wang, Hua; Niao, ZengQiang
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 149
Record Type:: Journal Article
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4. BTI mitigation by anti-ageing software patterns. (December 2017)

Authors:: Abbas, Haider Muhi; Halak, Basel; Zwolinski, Mark
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 79
Record Type:: Journal Article
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5. Characterization of materials and their interfaces in a direct bonded copper substrate for power electronics applications. (December 2017)

Authors:: Kabaar, A. Ben; Buttay, C.; Dezellus, O.; Estevez, R.; Gravouil, A.; Gremillard, L.
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 288
Record Type:: Journal Article
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6. CMOS micro-heater design for direct integration of carbon nanotubes. (December 2017)

Authors:: Roy, Avisek; Ender, Ferenc; Azadmehr, Mehdi; Aasmundtveit, Knut E.
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 517
Record Type:: Journal Article
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7. Comparative studies on microelectronic reliability issue of Sn whisker growth in Sn-0.3Ag-0.7Cu-1Pr solder under different environments. (December 2017)

Authors:: Wu, Jie; Xue, Songbai; Wang, Jingwen; Wang, Jianxin
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 124
Record Type:: Journal Article
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8. Comparing the degradation effect of a 'two-cell' Supercapacitor-module with and without voltage equalization circuit(s) under experimental self-discharge and load cycling tests. (December 2017)

Authors:: Ahmad Abubakar, Hadiza; Isa, Dino; Wan, Wong Yee
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 140
Record Type:: Journal Article
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9. Cycle life estimation of lithium-ion polymer batteries using artificial neural network and support vector machine with time-resolved thermography. (December 2017)

Authors:: Zhou, Xunfei; Hsieh, Sheng-Jen; Peng, Bo; Hsieh, Daniel
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 48
Record Type:: Journal Article
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10. Design methodology for over-temperature and over-current protection of an LDO voltage regulator by using electro-thermal simulations. (December 2017)

Authors:: Plesa, Cosmin-Sorin; Neag, Marius; Boianceanu, Cristian; Negoita, Andrei
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 509
Record Type:: Journal Article
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