Journal: Microelectronics and reliability / Issue: Volume 78(2017) - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Journal Microelectronics and reliability Issue Volume 78(2017)

11. Analysis on the difference of the characteristic between high power IGBT modules and press pack IGBTs. (November 2017)

Authors:: Deng, Erping; Zhao, Zhibin; Xin, Qingming; Zhang, Jingwei; Huang, Yongzhang
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 25
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

12. Assembly yield prediction of plastically encapsulated packages with a large number of manufacturing variables by advanced approximate integration method. (November 2017)

Authors:: Wei, Hsiu-Ping; Han, Bongtae; Youn, Byeng D.; Shin, Hyuk; Kim, Ilho; Moon, Hojeong
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 319
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

13. Battery remaining useful life prediction at different discharge rates. (November 2017)

Authors:: Wang, Dong; Yang, Fangfang; Zhao, Yang; Tsui, Kwok-Leung
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 212
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

14. Characterizing a RISC-V SRAM-based FPGA implementation against Single Event Upsets using fault injection. (November 2017)

Authors:: Ramos, Alexis; Maestro, Juan Antonio; Reviriego, Pedro
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 205
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

15. Color shift acceleration on mid-power LED packages. (November 2017)

Authors:: Lu, Guangjun; van Driel, W.D.; Fan, Xuejun; Fan, Jiajie; Qian, Cheng; Zhang, G.Q.
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 294
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

16. Comparative analysis of parameter extraction techniques for AlGaN/GaN HEMT on silicon/sapphire substrate. (November 2017)

Authors:: Majumdar, Shubhankar; Bag, Ankush; Biswas, Dhrubes
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 389
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

17. Comparison of the electro-thermal constraints on SiC MOSFET and Si IGBT power modules in photovoltaic DC/AC inverters. (November 2017)

Authors:: Dbeiss, Mouhannad; Avenas, Yvan; Zara, Henri
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 65
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

18. Comparison study on microstructure and mechanical properties of Sn-10Bi and Sn-Ag-Cu solder alloys and joints. (November 2017)

Authors:: Guo, Qinhan; Zhao, Zhenjiang; Shen, Chunlong
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 72
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

19. Cooling-controlled and reliable driving module for low-level light therapy LED helmet. (November 2017)

Authors:: Wang, Pengbo; Sun, Jiajing; Jiang, Qian; Li, Ting
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 370
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗

20. Degradation of adhesion between Cu and epoxy-based dielectric during exposure to hot humid environments. (November 2017)

Authors:: Ahn, Key-one; Park, Se-Hoon; Kim, Young-Ho
Journal:: Microelectronics and reliability
Issue:: Volume 78(2017)
Page Start:: 1
Record Type:: Journal Article
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗