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You searched for: Journal Solid-state electronics Issue Volume 148(2018)Limit your search
- 621.38152 12
- Semiconducteurs -- Périodiques 12
- Semiconductors -- Periodicals 12
- Admittance spectroscopy -- Organic light-emitting diodes -- Electron injection layer -- Electrical doping -- Space-charge-limited current 1
- Avalanche breakdown -- Schottky diodes -- Silicon carbide 1
- Copper interconnect -- Electromigration -- Experiment -- Model 1
- Gate-induced drain leakage -- Off-state stress -- Charge trapping -- Defect creation -- Polycrystalline silicon thin-film transistor 1
- Indium oxide nanowire -- FET -- Nanowire growth -- Photoconduction mechanism 1
- Internal gettering -- Oxygen precipitation -- RTA -- SIRM -- Local etching technique -- TEM 1
- MEMS -- Capacitive microphone -- SOI wafer -- Z-shape arms -- The smallest size 1