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You searched for: Journal Solid-state electronics Issue Volume 143(2018)Limit your search
- 621.38152 16
- Semiconducteurs -- Périodiques 16
- Semiconductors -- Periodicals 16
- Electrical characterization -- III-V materials -- InAs MOSFETs -- Low-frequency noise -- Random telegraph noise 1
- Gate-All-Around -- SOI MOSFET -- Nanowire -- Cryogenic temperature -- Short channel effects -- Analog parameters -- Quantum transport -- Low frequency noise -- Noise spectroscopy 1
- Gate-all-around MOSFET -- Nanowire -- Monte Carlo simulation -- Multi-subband -- Short-channel effects 1
- MOSFET scaling -- 2D materials -- MoS2MOSFET -- End of scaling 1
- Nanonet -- Silicon nanowire -- Threshold voltage dispersion -- Electrical parameter extraction 1
- RRAM -- Non-volatile memory -- Nanoparticles -- Indium oxide 1
- SOI -- FDSOI -- MOSFET -- Floating-body effect -- Kink effect -- Super-coupling -- Body potential 1