Author/Creator: Zubert, Mariusz - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Author/Creator Zubert, Mariusz

1. Comparison of Green׳s function solutions for different heat conduction models in electronic nanostructures. Issue 12 (December 2015)

Authors:: Janicki, Marcin; Samson, Agnieszka; Raszkowski, Tomasz; Zubert, Mariusz; Napieralski, Andrzej
Journal:: Microelectronics journal
Issue:: Volume 46:Issue 12 Part A (2015)
Page Start:: 1162
Record Type:: Journal Article
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2. Experimental investigation of discrete air cooled device thermal resistance dependence on cooling conditions. (December 2017)

Authors:: Janicki, Marcin; Torzewicz, Tomasz; Samson, Agnieszka; Raszkowski, Tomasz; Sobczak, Artur; Zubert, Mariusz; Napieralski, Andrzej
Journal:: Microelectronics and reliability
Issue:: Volume 79(2017)
Page Start:: 405
Record Type:: Journal Article
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3. Improvement of an electro‐thermal model of SiC MPS diodes. Issue 4 (1st April 2018)

Authors:: Starzak, Łukasz; Stefanskyi, Andrii; Zubert, Mariusz; Napieralski, Andrzej
Journal:: IET power electronics
Issue:: Volume 11:Issue 4(2018)
Page Start:: 660
Record Type:: Journal Article
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4. Influence of temperature and heat flux time lags on the temperature distribution in modern GAAFET structure based on Dual-Phase-Lag thermal model. (July 2018)

Authors:: Raszkowski, Tomasz; Samson, Agnieszka; Zubert, Mariusz
Journal:: Microelectronics and reliability
Issue:: Volume 86(2018)
Page Start:: 10
Record Type:: Journal Article
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5. Methodology of determining the applicability range of the DPL model to heat transfer in modern integrated circuits comprised of FinFETs. (December 2018)

Authors:: Zubert, Mariusz; Raszkowski, Tomasz; Samson, Agnieszka; Zając, Piotr
Journal:: Microelectronics and reliability
Issue:: Volume 91(2018)Part 1
Page Start:: 139
Record Type:: Journal Article
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6. The distributed thermal model of fin field effect transistor. (December 2016)

Authors:: Zubert, Mariusz; Raszkowski, Tomasz; Samson, Agnieszka; Janicki, Marcin; Napieralski, Andrzej
Journal:: Microelectronics and reliability
Issue:: Volume 67(2016)
Page Start:: 9
Record Type:: Journal Article
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