1. A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes. (15th March 2018) Authors: Yang, Sheng; Zhang, Ke; Ricciardulli, Antonio Gaetano; Zhang, Panpan; Liao, Zhongquan; Lohe, Martin R.; Zschech, Ehrenfried; Blom, Paul W. M.; Pisula, Wojciech; Müllen, Klaus; Feng, Xinliang Journal: Angewandte Chemie Issue: Volume 130:Number 17(2018) Page Start: 4767 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A Delamination Strategy for Thinly Layered Defect‐Free High‐Mobility Black Phosphorus Flakes. Issue 17 (15th March 2018) Authors: Yang, Sheng; Zhang, Ke; Ricciardulli, Antonio Gaetano; Zhang, Panpan; Liao, Zhongquan; Lohe, Martin R.; Zschech, Ehrenfried; Blom, Paul W. M.; Pisula, Wojciech; Müllen, Klaus; Feng, Xinliang Journal: Angewandte Chemie international edition Issue: Volume 57:Issue 17(2018) Page Start: 4677 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. A New In Situ Microscopy Approach to Study the Degradation and Failure Mechanisms of Time‐Dependent Dielectric Breakdown: Set‐Up and Opportunities1. Issue 5 (17th April 2014) Authors: Liao, Zhongquan; Gall, Martin; Yeap, Kong Boon; Sander, Christoph; Aubel, Oliver; Mühle, Uwe; Gluch, Jürgen; Niese, Sven; Standke, Yvonne; Rosenkranz, Rüdiger; Löffler, Markus; Vogel, Norman; Beyer, Armand; Engelmann, Hans‐Jürgen; Guttmann, Peter; Schneider, Gerd; Zschech, Ehrenfried; Zschech, Eh... Journal: Advanced engineering materials Issue: Volume 16:Issue 5(2014:May) Page Start: 486 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. A novel micro-double cantilever beam (micro-DCB) test in an X-ray microscope to study crack propagation in materials and structures. (September 2018) Authors: Kutukova, Kristina; Niese, Sven; Gelb, Jeff; Dauskardt, Reinhold; Zschech, Ehrenfried Journal: Materials today communications Issue: Volume 16(2018) Page Start: 293 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation. (23rd September 2015) Authors: Huang, Jin; Loeffler, Markus; Muehle, Uwe; Moeller, Wolfhard; Mulders, Hans; Kwakman, Laurens; Zschech, Ehrenfried Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1839 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. A Study of Gallium FIB induced Silicon Amorphization using TEM, APT and BCA Simulation. (August 2015) Authors: Huang, Jin; Loeffler, Markus; Muehle, Uwe; Moeller, Wolfhard; Mulders, Hans; Kwakman, Laurens; Zschech, Ehrenfried Journal: Microscopy and microanalysis Issue: Volume 21(2015:Jun.)Supplement 3 Page Start: 1839 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Area-selective atomic layer deposition of Ru on electron-beam-written Pt(C) patterns versus SiO2 substratum. (6th September 2017) Authors: Junige, Marcel; Löffler, Markus; Geidel, Marion; Albert, Matthias; Bartha, Johann W; Zschech, Ehrenfried; Rellinghaus, Bernd; Dorp, Willem F van Journal: Nanotechnology Issue: Volume 28:Number 39(2017) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Back Cover: Advanced Engineering Materials 5∕2014. Issue 5 (May 2014) Authors: Zschech, Ehrenfried Journal: Advanced engineering materials Issue: Volume 16:Issue 5(2014:May) Page Start: 595 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Band‐Like Charge Transport in Phytic Acid‐Doped Polyaniline Thin Films. (6th August 2021) Authors: Ballabio, Marco; Zhang, Tao; Chen, Chen; Zhang, Peng; Liao, Zhongquan; Hambsch, Mike; Mannsfeld, Stefan C. B.; Zschech, Ehrenfried; Sirringhaus, Henning; Feng, Xinliang; Bonn, Mischa; Dong, Renhao; Cánovas, Enrique Journal: Advanced functional materials Issue: Volume 31:Number 43(2021) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. BEoL stack robustness investigations utilizing Cu-pillar immobilization and micromechanical loading methods. (September 2022) Authors: Silomon, Jendrik; Chimeg, Dulguun; Gluch, Jürgen; Clausner, André; Zschech, Ehrenfried Journal: Microelectronics and reliability Issue: Volume 136(2022) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗