1. 'Statistics for microelectronics', ASMBI, v. 29, issue 4, July/August 2013, pages 315–318. (24th October 2013) Authors: Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego Journal: Applied stochastic models in business and industry Issue: Volume 30:Number 4(2014:Jul./Aug.) Page Start: 517 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. A virtual metrology system based on least angle regression and statistical clustering. (17th September 2012) Authors: Susto, Gian Antonio; Beghi, Alessandro; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego Journal: Applied stochastic models in business and industry Issue: Volume 29:Number 4(2013:Jul./Aug.) Page Start: 362 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Determining the target value of ACICD to optimize the electrical characteristics of semiconductors using dual response surface optimization. (26th March 2013) Authors: Lee, Dong‐Hee; Kim, Kwang‐Jae; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego Journal: Applied stochastic models in business and industry Issue: Volume 29:Number 4(2013:Jul./Aug.) Page Start: 377 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Identification of spatial defects in semiconductor manufacturing. (23rd March 2021) Authors: Borgoni, Riccardo; Galimberti, Chiara; Zappa, Diego Other Names: Berni Rossella guestEditor.; Fidalgo Jesús Fernando López guestEditor.; Vining Geoff G. guestEditor. Journal: Applied stochastic models in business and industry Issue: Volume 37:Number 5(2021) Page Start: 878 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Industrial statistics applications in the semiconductor industry: some examples. (11th December 2012) Authors: Kenett, Ron S.; Zacks, Shelemyahu; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego Journal: Applied stochastic models in business and industry Issue: Volume 29:Number 4(2013:Jul./Aug.) Page Start: 319 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Kriging prediction from a circular grid: application to wafer diffusion. (22nd July 2013) Authors: Pistone, Giovanni; Vicario, Grazia; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego Journal: Applied stochastic models in business and industry Issue: Volume 29:Number 4(2013:Jul./Aug.) Page Start: 350 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Mixed response surface models and Bayesian analysis of variance components for electrically conductive adhesives. (25th April 2013) Authors: Berni, Rossella; Scarano, Valeria Leonarda; Bertocci, Francesco; Catelani, Marcantonio; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego Journal: Applied stochastic models in business and industry Issue: Volume 29:Number 4(2013:Jul./Aug.) Page Start: 387 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Model‐based process capability indices: The dry‐etching semiconductor case study. (16th July 2020) Authors: Borgoni, Riccardo; Zappa, Diego Journal: Quality and reliability engineering international Issue: Volume 36:Number 7(2020) Page Start: 2309 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Nonparametric permutation and combination‐based multivariate control charts with applications in microelectronics. (6th May 2013) Authors: Corain, Livio; Salmaso, Luigi; Borgoni, Riccardo; Deldossi, Laura; Radaelli, Luigi; Zappa, Diego Journal: Applied stochastic models in business and industry Issue: Volume 29:Number 4(2013:Jul./Aug.) Page Start: 334 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Non‐parametric local capability indices for industrial planar manufacts: An application to the etching phase in the microelectronic industry. (16th February 2022) Authors: Borgoni, Riccardo; Farace, Vincenzo Emanuele; Zappa, Diego Other Names: Reis Marco S. guestEditor.; Haselgruber Nikolaus guestEditor. Journal: Applied stochastic models in business and industry Issue: Volume 38:Number 5(2022) Page Start: 884 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗