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Author/Creator Zagni, Nicolò

3. The impact of interface and border traps on current–voltage, capacitance–voltage, and split‐CV mobility measurements in InGaAs MOSFETs. Issue 3 (15th November 2016)

Authors:
Pavan, Paolo; Zagni, Nicolò; Puglisi, Francesco Maria; Alian, Alireza; Thean, Aaron Voon‐Yew; Collaert, Nadine; Verzellesi, Giovanni
Journal:
Physica status solidi
Issue:
Volume 214:Issue 3(2017)
Page Start:
n/a
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗

4. The Role of Carbon Doping on Breakdown, Current Collapse, and Dynamic On‐Resistance Recovery in AlGaN/GaN High Electron Mobility Transistors on Semi‐Insulating SiC Substrates. Issue 7 (10th December 2019)

Authors:
Zagni, Nicolò; Chini, Alessandro; Puglisi, Francesco Maria; Pavan, Paolo; Verzellesi, Giovanni
Other Names:
Shahedipour-Sandvik F. Shadi guestEditor.; Qhalid Fareed guestEditor.
Journal:
Physica status solidi
Issue:
Volume 217:Issue 7(2020)
Page Start:
n/a
Record Type:
Journal Article
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗